Recombination lifetime measurements in silicon /
Bewaard in:
| Andere auteurs: | , , |
|---|---|
| Formaat: | Boek |
| Taal: | Engels |
| Gepubliceerd in: |
West Conshohocken, PA :
ASTM,
c1998.
|
| Onderwerpen: | |
| Tags: |
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| LEADER | 00000nam a2200000 a 4500 | ||
|---|---|---|---|
| 001 | 6429 | ||
| 003 | OSt | ||
| 005 | 20130901095217.0 | ||
| 008 | 130901s1998 paua b 001 0 eng d | ||
| 010 | |a 98022034 | ||
| 020 | |a 0803124899 | ||
| 040 | |a DLC |c DLC |d DLC |d BD-DhMIS | ||
| 050 | 0 | 0 | |a TK7871.852 |b .R43 1998 |
| 082 | 0 | 0 | |a 621.3815/2 |2 21 |
| 245 | 0 | 0 | |a Recombination lifetime measurements in silicon / |c Dinesh C. Gupta, Fred R. Bacher, and William M. Hughes, editors. |
| 260 | |a West Conshohocken, PA : |b ASTM, |c c1998. | ||
| 300 | |a 392 p. : |b ill. ; |c 24 cm. | ||
| 500 | |a Papers presented at the Advanced Workshop on Silicon Recombination Lifetime Characterization Methods, held in Santa Clara, Calif on June 2-3, 1997. | ||
| 500 | |a "STP 1340." | ||
| 504 | |a Includes bibliographical references and indexes. | ||
| 541 | |e 6429 | ||
| 650 | 0 | |a Semiconductors |x Testing |x Congresses. | |
| 650 | 0 | |a Service life (Engineering) |x Forecasting |x Congresses. | |
| 650 | 0 | |a Electronic measurements |x Congresses. | |
| 700 | 1 | |a Gupta, Dinesh C. | |
| 700 | 1 | |a Bacher, Fred R. | |
| 700 | 1 | |a Hughes, William M. | |
| 942 | |2 ddc |c REF | ||
| 999 | |c 1074 |d 1074 | ||